THC2I1
Fermilab, Batavia, Illinois, USA
Beam profiling is an important aspect of controlling the behavior of the beam. Poorly controlled beams result in beam losses due to aperture restrictions leading to both lower intensity for the downstream experiments and increased radiation along the beamline. Since hadrons are much heavier than electrons, the availability of synchrotron radiation as a profiling mechanism is generally not available except at very high energies. This talk will present a summary of other non-invasive transverse profiling techniques used at hadron accelerators, including residual gas ionization and fluorescence, electron beam scanning, and laser stripping of bound electrons.
